reSeArCH Letter
Extended Data Fig. 3 | Refined X-ray diffraction patterns from
Ca[Si0.6Ti0.4]O 3 perovskite. a–c, Rietveld refinements of Ca[Si0.6Ti0.4]O 3
samples: a, in P 21 /c with LaB 6 calibrant, at 300 K and ambient pressure;
b, in the tetragonal I4/m structure (with other cell components) at 890 K
and high pressure (about 12 GPa); and c, in Fm 3 m at 1,336 K and high
pressure (12 GPa). In each panel, the black dots are the collected data, the
blue curve the model pattern and the green curve the residual. The
coloured tick-marks indicate the positions of diffraction peaks of each
phase.