The nonzero FCA in both metamaterials
indicates that they are indeed HOTIs, and
we have argued above that they should host
second-order topological modes at their corners.
Because we have not observed these expected
topological modes within the bulk bandgap,
we can estimate their spectral location by find-
ing the band in which the corner resonators
are most strongly excited. In theC 4 -symmetric
system, the corner resonators, around which
the second-order topological modes are ex-
pected to exist, are mainly excited in band 3,
which indicates that the corner modes lie in
this band. Moreover, this implies that we can
spectrally localize these modes by slightly
lowering the resonance frequency of the cor-
ner resonators. As illustrated in Fig. 3A, we
applied a small negative potential to the cor-
ner resonators using a capacitor connected to
ground, which decreases the electrical length
(and thus the resonance frequency) of the cor-
ner resonators. When the potential is applied,
we observe topological modes moving into the
bandgap between bands 2 and 3 and becom-
ing exponentially localized to the corner and
confined to one sublattice.
In theC 3 -symmetric system, the corner reso-
nators are only excited in band 2, which again
indicates that the energy of the corner modes
is too high and should be lowered to bring the
modes into the bandgap. We pull these modes
into the bandgap by similarly applying a small
negative potential to the corners, as illustrated
in Fig. 3B. The topological modes are observed
to spectrally localizewithin the bandgap and
spatially localize to the corners with confine-
ment on one sublattice. We also conducted a
similar experiment on a trivial insulator ( 30 )
and found that localized corner modes cannot
be isolated within the bulk bandgap, regard-
less of the applied potential strength.
The definition of the FCA can also be extended
beyond two dimensions to identifyd-th–order
topology in fully gappedd-dimensional insu-
lators. For example, the FCA for third-order
TCIs in three dimensions is
f¼
X
i;j
ðdrjsiÞmod 1 ð 3 Þ
wheredis corner-localized fractional mode
density,rjis hinge-localized fractional mode
density, andsiis surface-localized fractional
mode density. Because this indicator captures
fundamental topological features that are pro-
tected by spatial symmetries, we expect that it
can assist with the experimental identifica-
tion of materials with higher-order topology,
which could otherwise be misidentified by
only searching for in-gap corner modes. From
a practical perspective, focusing on bulk-
derived fractional mode density instead of
localized modes could simplify experimental
confirmations of novel TIs, which often use
ad hoc supplementary boundary elements (e.g.,
auxiliary resonators or loading capacitors) to
spectrally shift topological modes into the
bandgap ( 22 – 25 , 28 , 29 , 31 ).
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Fig. 3. Pulling topological modes into the gap.(A) The schematic on the left shows where a small, negative on-site potential is applied (white circles). The
measured DOS has modes within the bulk bandgap, which are spatially localized to the corners and confined to one sublattice. (B) Same as (A) but for the
C 3 -symmetric insulator.
RESEARCH | REPORT