538 INDEX
Lagrangian density, 308
Lambertian source, 88, 92
Langevin force, 114
laser linewidth, 116, 498
laser threshold, 94
lattice constant, 82, 85, 86
LED, 87–92
bandwidth of, 91
broad-spectrum, 92
coupling efficiency for, 119
edge-emitting, 92
modulation response of, 90
P–I characteristics of, 87
reliability of, 125
resonant-cavity, 92
responsivity of, 89
spectral distribution of, 89
structures for, 91
surface-emitting, 91, 119
temperature dependence of, 89
transfer function of, 90
lens coupling, 119, 120
light-emitting diodes,seeLED
lightwavesystems
amplifiers for, 261–272
architectures for, 183
coherent,seecoherent systems
components of, 16–19
design of, 188–195
dispersion-limited, 50–53, 190–192,
269, 279–281
evolution of, 4–8
high-capacity, 310–320, 331
history of, 1–4
long-haul, 195–202
loss-limited, 189–190
point-to-point, 183–185
quasi-linear, 309
soliton,seesoliton systems
spectral efficiency of, 332
subcarrier,seeSCM systems
submarine, 306
TDM,seeTDM systems
terrestrial, 198–200, 306
undersea, 124, 200–202, 266
unguided, 15
WDM,seeWDM systems
LiNbO 3 technology, 304, 355, 357
linear channel, 150
transfer function of, 151
linewidth enhancement factor, 110, 113, 117,
212, 237, 282, 416
liquid crystal, 341, 356
liquid-phase epitaxy, 86
load resistor, 150, 157
local oscillator, 479–482
intensity noise of, 500
linewidth of, 498
local-area network,seenetworks
Lorentzian spectrum, 60, 117, 227
loss
bending, 58, 289
cavity, 95, 99, 107
channel, 192
connector, 72, 192
coupling, 243, 346, 359
distribution, 188
fiber, 55–59, 189, 301, 418
insertion, 186, 289, 298, 304, 356
internal, 95, 236, 341
mode-selective, 202
polarization-dependent, 45, 197, 456
scattering, 236
splice, 72, 192
loss management, 418–427
lumped amplification, 420–422, 461Mach–Zehnder interferometer, 123, 342, 346,
377, 410
map period, 306, 372, 432
map strength, 433
critical, 433
Marcum’sQfunction, 495
Markoffian approximation, 114
matched-filter detection, 389
material absorption, 56
material dispersion,seedispersion
Maxwell’s equations, 29
mean time to failure, 124
MEMS technology, 106, 355
meridional rays, 26
metropolitan-area network,seenetworks
Michelson interferometer, 343, 359, 374
microlens, 345
micromirror, 355
microstrip line, 287
microwavecommunication, 2, 381, 478
microwavesubcarrier, 382
Mie scattering, 58
modal noise, 202