SEMICONDUCTOR DEVICE PHYSICS AND DESIGN

(Greg DeLong) #1
3.11. FURTHER READING 145

whereτis the carrier lifetime. Calculate the following:


  • What fraction of the donors is ionized?

  • What is the diffusion length of holes in this material?
    Use the following data:


μn= 1100 cm^2 /V·s:μp= 400 cm^2 /V·s

Problem 3.20Calculate the area density of surface states that would lead tosurface
generationrate of a fully depleted surface to equaltwice the generation rate in the surface
depletion region.Consider the states to be characterized by a capture cross-section of
10 −^15 cm^2 and the thermal velocity to be 107 cms. Assume the surface depletion region to
be 1 μmwide and the time constantτ 0 =1μs.

3.11FURTHERREADING ...............................



  • Transport in crystalline materials

    • M. Lundstrom,FundamentalsofCarrierTransport (Modular Series on Solid State
      Devices), eds. by G.W, Neudeck and R.F. Pierret, Addison-Wesley, Reading, MA,
      vol. X (1990).

    • J. Singh,ModernPhysicsforEngineers, Wiley-Interscience, New York (1999).

    • K. Seeger,SemiconductorPhysics, Springer Verlag, New York (1985).

    • J. Singh,ElectronicandOptoelectronicPropertiesofSemiconductors, Cambridge
      University Press (2003).



  • Transport in disordered materials

    • N.F. Mott and E.A. Davis,ElectronicProcessesinNon-CrystallineMaterials, Claren-
      den Press, Oxford (1971).

    • A.J. Moulson and J.M. Herbert, Electroceramics: Materials, Properties, and
      Applications, Chapman & Hall (1992).



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