SEMICONDUCTOR DEVICE PHYSICS AND DESIGN

(Greg DeLong) #1
4.9. LIGHT EMITTING DIODE (LED) 203

From the previous example, we can see that forpequal to 1016 cm−^3 , we have (in the
previous example the value ofpwas ten times smaller)

τr=5. 7 × 10 −^7 s

In the case where thep-doping is high, the recombination time is given by the high-density
limit (see equation 4.9.10) as

1
τr

=

Rspon
n

=

1

τo

(

m∗r
m∗h

) 3 / 2

τr =

τo
0. 05

∼ 20 τo∼12 ns

For the low-doping case, the internal quantum efficiency for the diode is

ηQr=

1

1+tτnrr

=

1

1+(5.7)

=0. 15

For the more heavily dopedp-region diode, we have

ηQr=

1

1+ 2010 × 10 −^7 − 9

=0. 83

Thus there is an increase in the internal efficiency as thepdoping is increased.

Example 4.7Consider a GaAsp-ndiode with the following parameters at 300 K:

Electron diffusion coefficient, Dn =30cm^2 /V·s
Hole diffusion coefficient, Dp =15cm^2 /V·s
p-side doping, Na =5× 1016 cm−^3
n-side doping, Nd =5× 1017 cm−^3
Electron minority carrier lifetime, τn =10−^8 s
Hole minority carrier lifetime, τp =10−^7 s

Calculate the injection efficiency of the LED assuming no recombination due to traps.
The intrinsic carrier concentration in GaAs at 300 K is 1. 84 × 106 cm−^3 .Thisgives

np =

n^2 i
Na

=

(1. 84 × 106 )^2

5 × 1016

=6. 8 × 10 −^5 cm−^3

pn =

n^2 i
Nd

=

(1. 84 × 106 )^2

5 × 1017

=6. 8 × 10 −^6 cm−^3

The diffusion lengths are

Ln =


Dnτn=

[

(30)(10−^8 )

] 1 / 2

=5. 47 μm

Lp =


Dpτp=

[

(15)(10−^7 )

] 1 / 2

=12. 25 μm
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