Handbook of Civil Engineering Calculations

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CORRESPONDENCE BETWEEN POISSON
FAILURE AND NEGATIVE-EXPONENTIAL
LIFE SPAN

The failure of a certain type of device has a Poisson probability, and the mean number of
failures in 1500 h of operation is 6. What is the reliability of the device for 270 h of oper-
ation?

Calculation Procedure:


  1. Compute the mean life span
    Refer to the previous calculation procedure pertaining to the Poisson probability distri-
    bution. Consider the following: A device is set in operation. When this device fails, a
    device of identical type is set in operation, and this replacement process continues in-
    definitely. Let X denote the number of failures in time t, and assume that X has a Pois-
    son probability distribution. Thus the probability that exactly 1 failure will occur in 1 h
    remains constant as time elapses. It can readily be shown that the life span of the de-
    vice, which is the time interval between successive failures, has a negative-exponential
    probability distribution.
    Select 1 h as the unit of time. Then mean life span IJL = 1500/6 = 250 h.

  2. Compute the reliability
    Apply Eq. c of the preceding calculation procedure, giving a = I/JJL= 1/250. Now apply
    Eq. b, giving /2(270) = <r270/250 = e~im = 0.340.


PROBABILITY OF FAILURE DURING
A SPECIFIC PERIOD


The life span of a device is negative-exponential, and its mean value is 8 days. What is the
probability that the device will fail on the fifth day?


Calculation Procedure:


  1. Set up the probability equation
    Set T = life span, and refer to Fig. 26. As previously stated, P(t{ < T < t 2 ) = area under
    curve from J 1 to J 2. It follows that P(Y 1 < T < J 2 ) = RQ 1 ) - R(t 2 ). Take 1 day as the unit of
    time. So P(4 < T < 5) - R(4) - R(5).

  2. Compute the probability
    Set a =11 IJi= 1/8. Then R(t) = e~at = e~t/s, or R(4) - e^ = 0.607 and R(5) - e~5/ = 0.535.
    Thus, P(4 < T < 5) = 0.607 - 0.535 - 0.072.


Related Calculations'. Assume that the device has been operating for some
time. In accordance with the statement previously made, the probability that this device
will fail on the fifth day from the present is 0.072, regardless of the present age of the
device.

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