Scanning Electron Microscopy and X-Ray Microanalysis

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With square pixels, the shape of an object is faithfully trans-
ferred, as shown in. Fig. 6.5a, while non-square pixels in the
specimen scan result in distortion in the displayed image,


. Fig. 6.5b.
Note that for all measurements the calibration artifact must
be placed normal to the optic axis of the SEM to eliminate
image foreshortening effects (see further discussion below).


Using a Calibrated Structure in ImageJ-Fiji


The image-processing software engine ImageJ-Fiji includes a
“Set Scale” function that enables a user to transfer the image
calibration to subsequent measurements made with various


functions. As shown in. Fig. 6.6a, starting with an image
of a primary or secondary calibration artifact (i.e., where
“secondary” refers to a commercial vendor artifact that is
traceable to a primary national measurement calibration
artifact) that contains a set of defined distances, the user
can specify a vector that spans a particular pitch to establish
the calibration at that magnification setting. This calibra-
tion procedure should then be repeated to cover the range
of magnification settings to be used for subsequent measure-
ments of unknowns. Note that the calibration that has been
performed is only strictly valid for the SEM working distance
at which the calibration artifact has been imaged. When a

Beam locations on specimen
and specimen pixels Beam locations in computer memory
and display pixels

l
L

l'

b

Beam locations on specimen
and specimen pixels

Beam locations in computer memory
and display pixels

l

L

l

. Fig. 6.5 a Careful calibration a
of the x- and y-scans produces
square pixels, and a faithful repro-
duction of shapes lying in the
scan plane perpendicular to the
optic axis. b Distortion in the dis-
play of an object caused by non-
square pixels in the image scan


6.3 · Making Dimensional Measurements With the SEM: How Big Is That Feature?

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