Scanning Electron Microscopy and X-Ray Microanalysis

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. Fig. 8.8 Threshold imaging visibility; image sequence with increasing pixel dwell time at constant beam current. Inkjet deposited droplet on
carbon planchet; E 0 = 10 keV; Everhart–Thornley (positive bias) detector. Post-collection processing with ImageJ (FIJI) CLAHE function

Chapter 8 · The Visibility of Features in SEM Images