Scanning Electron Microscopy and X-Ray Microanalysis

© Springer Science+Business Media LLC 2018

J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis,

https://doi.org/10.1007/978-1-4939-6676-9_15

201

SEM Case Studies

15

15.1 Case Study: How High Is That Feature Relative to Another?

Another? – 202

15.2 Revealing Shallow Surface Relief

15.3 Case Study: Detecting Ink-Jet Printer Deposits