Scanning Electron Microscopy and X-Ray Microanalysis

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. Fig. 17.1 The preferences dialog showing a panel containing properties of a detector
. Table 17.1 This table identifies parameters that have a critical influence on simulated spectra and those that have a less critical
influence. You should be able to determine the correct value of the critical parameters from vendor literature or a call to the vendor.
The vendor may be able to provide the less critical values too but if they can’t just accept the defaults

Critical Less critical

Window type Gold layer (accept the default)

Elevation angle Aluminum layer (accept the default)

Optimal working distance Nickel layer (accept the default)

Sample-to-detector distance (estimate) Dead layer (accept the default)

Detector area Zero strobe discriminator (easy to estimate)

Crystal thickness

Number of channels

Energy scale (nominal)

Zero offset (nominal)

Resolution at Mn Kα (approximate)

Azimuthal angle

17.1 · Getting Started With NIST DTSA-II