Scanning Electron Microscopy and X-Ray Microanalysis

325 20

. Fig. 20.11 a Stainless steel, fitting for Si, Cr, Fe, Ni, and Mo; residual in blue. b Expanded vertical scale, note detection of Mn. c Stainless steel,
fitting for Si, Cr, Mn, Fe, Ni, and Mo; residual in blue. d Comparison of residuals with fitting for Mn (red) and without (blue)

b

0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0

6 000

4 000

2 000

0

Photon energy (keV)

Counts

a

100 000

80 000

60 000

40 000

20 000

0

0.0 1.0 2.0 3.0 4.0 5.0 6.0

Photon energy (keV)

Counts

7.0 8.0 9.0 10.0

Stainless steel

E 0 = 20 kev

c

0

0.0 1.0 2.0 3.0 4.0 5.0 6.0

Photon energy (keV)

Counts

7.0 8.0 9.0 10.0

6 000

4 000

2 000

d

0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0

3 000

4 000

2 000

1 000

0

Photon energy (keV)

Counts

Stainless steel

Residual without Mn

Residual with Mn

StainlessSteel_RR_20kV

StainlessSteel_RR_residual

StainlessSteel_RR_20kV

StainlessSteel_RR_residual

StainlessSteel_RR_20kV

StainlessSteel_RR_residual

Residual[StainlessSteel_RR_20kV]

Residual[StainlessSteel_RR_20kV]

20.4 · The Need for an Iterative Qualitative and Quantitative Analysis Strategy