Scanning Electron Microscopy and X-Ray Microanalysis

387 23

Analysis with a compromised sample shape:

surface gouge crater left by tool impact

a

Mg (normalized weight percent)

Fe (normalized weight percent)

Analysis of K411: Bulk polished and tool gouge crater

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BULK-K411

BULK-600grit

1

Extent of ideal

flat specimen

measurements

b

. Fig. 23.8 a SEM (ET+)
SE + BSE image of a crater pro-
duced in polished K411 glass
after gouging with a diamond
scribe. b Plot of the normalized
Mg and Fe concentrations calcu-
lated for measurements at vari-
ous locations in this crater

23.4 · Useful Indicators of Geometric Factors Impact on Analysis