Scanning Electron Microscopy and X-Ray Microanalysis

487 28

a b

c d

. Fig. 28.10 CL study of GaN structures grown on Si: a SEM SE image (E 0 = 2 keV); b panchromatic CL image; c CL spectrum image data analyzed
to derive the central wavelength value; d RGB composite (Example courtesy of D. Stowe, Gatan, Inc.)

28.3 · Applications of CL