Scanning Electron Microscopy and X-Ray Microanalysis

VI

Throughout their history, the authors of the
SEMXM textbooks have been closely associated
as lecturers with the Lehigh University Summer
Microscopy School. The opportunity to teach and
interact with each year’s students has provided a
very useful experience in understanding the com-
munity of users of the technique and its evolution
over time. We hope that these interactions have
improved our written presentation of the subject
as a benefit to newcomers as well as established
practitioners.

Finally, the author team sadly notes the passing in

2015 of Professor Joseph I.  Goldstein (University

of Massachusetts, Amherst) who was the “found-

ing father” of the Lehigh University Summer

Microscopy School in 1970, and who organized

and contributed so extensively to the microscopy

courses and to the SEMXM textbooks throughout

the ensuing 45 years. Joe provided the stimulus to

the production of SEMXM4 with his indefatigable

spirit, and his technical contributions are embed-

ded in the X-ray microanalysis sections.

Dale E. Newbury

Nicholas W.M. Ritchie

John Henry J. Scott

Gaithersburg, MD, USA

Joseph R. Michael

Albuquerque, NM, USA

David C. Joy

Knoxville, TN, USA

Preface