(^12) DESIGN WORLD — EE NETWORK 6 • 2019 eeworldonline.com | designworldonline.com
TEST & MEASUREMENT HANDBOOK
Verifying that 5G devices conform to specific feature sets
is another consideration. The focus today is on relatively simple
capabilities — two-component-carrier (2 CC), carrier aggregation
(CA), for example — but 5G equipment will quickly ramp up
to higher bandwidths with more carriers. This scenario is one
reason why engineers need test solutions that support up to eight
component carriers (8 CCs) in single instrument.
Again, a signal analyzer will be the instrument of choice to test
5G device performance. Among the RF tests that must take place
with a high degree of accuracy are frequency power, EVM, and
spurious emissions. These tests require a signal analyzer with a high
dynamic range as well as extremely flat amplitude and phase.
Though the emphasis today is on 5G NR, beamforming and
other mmWave applications are not far behind. These higher-
frequency 5G designs create special test factors, as engineers must
conduct static tests on devices and antennas in active beamforming
environments. Engineers need to determine how many points
are necessary to obtain measurements, trading off measurement
accuracy for an acceptable verification time/cost of test.
One of the most important tests on mmWave devices is
propagation loss. Signal power at mmWave frequencies can
drop significantly from path loss caused by environmental
conditions, much more so than the path loss experienced at
traditional frequencies (i.e., ≤ = 6 GHz). At 28 GHz, the path loss is
approximately 40 dB higher than at traditional LTE frequencies. This
is considerable because the received power at the far end of the link
is halved for every 3 dB of path loss. Engineers need test solutions
that can conduct this critical measurement with a high degree
of accuracy.
COST-OF-TEST AND TIME-TO-MARKET
Engineers designing and manufacturing their chipsets and devices
have more to consider than the complexities associated with 5G.
Test solution companies must work with customers to develop
environments that minimize costs. Test times are important at
sub-6 GHz, but their importance will be compounded at mmWave
frequencies where the tests inherently can take significantly longer.
In response, test solutions will need to be built on flexible
platforms that facilitate upgrades of current solutions. This approach
allows engineers to protect their investments in existing test solutions
and economically upgrade to 5G. It also saves time because
engineering staff needn’t learn new instrument controls, operations,
and test cases.
Software will also play a key role in 5G testing. With appropriate
software, a single instrument can verify 5G NR, as well as LTE, LTE-
Advanced, and other legacy technologies, saving time and money.
Future standards can be addressed with software rather than via
purchasing more expensive hardware.
In a nutshell, 5G presents several test challenges for engineers,
ranging from higher frequencies and performance expectations to
more complex designs, time and cost pressures. Test instruments
having flexibility and reliability will bring the efficiencies needed to
meet current requirements and evolve as 5G advances.
Anritsu Co. 5G
https://www.anritsu.com/en-US/test-measurement/technologies/5g-
everything-connected/5g-everything-connected-detail
Parameter NFM FFM
Measurement location Simple radio anechoic box Radio anechoic chamber
Measurement range Near field about 3 λ (ex. 15
to 25 mm @ 60 GHz)
Far field (ex. 3 m or 10m)
Radiation pattern measurement 3D 2D
(3D radiation pattern measurement
requires time and facilities)
Antenna diagnostics and
analysis
Ye s Difficult
Comparison of NFM and FFM
A comparison of FFM and NFM.
Anritsu — Test and Measurement HB 06-19.indd 12 6/7/19 12:04 PM
amelia
(Amelia)
#1