INDEX 759
electron capture, 236
electron equilibrium, 637
electron focusing, 372
electron ion pairs
production, 149
w-value, 150
electron spectroscopy, 698
electron trapping, 236
electronic noise, 509
endpoint energy, 44
energy fluence rate, 609
energy flux, 610
energy spectroscopy, 719
energy straggling, 117, 132, 150
energy stragglling, 130
Enrico Fermi, 5
equivalent dose, 605
error propagation, 549
ESCA, 698
EXAFS, 680
exciton luminescence, 351
expectation value, 530
exposure, 611, 619
acute, 658
chronic, 659
genetic effects, 660
limits, 660
somatic effects, 660
FAS, 706
FASTBUS standard, 729
Fermi chopper spectrometer, 708
Fermi level, 251, 254
film dosimetry, 633, 634
filtering, 490
band pass, 493
high pass, 493
low pass, 491
fission, 139
fission fragements, 5
fission fragments, 54
flat ribbon cable, 479
fluors, 344
Fourier transform, 425, 563
frequency domain analysis, 563
Frisch grid, 178
FWHM, 431, 674
g-value, 222
Gamma constant, 613
gamma distribution, 544
gamma function, 544
gaseous detectors
contamination, 200
dissociative capture, 201
efficiency, 207
radiative capture, 201
recombination losses, 198
space charge, 202
Gaussian distribution, 532, 539, 543,
547
Geiger breakdown, 192
Geiger-Mueller counter, 191
advantages and disadvantages, 198
dead time, 194
gases, 196
Geiger breakdown, 192
IV-characteristics, 193
quenching, 197
Geiger-Mueller region, 166
germline mutations, 660
glow curve, 628
GM detector, 166half value layer, 665
Henri Bacquerel, 4
heterojunction diode, 300
HFBS, 706
high density interconnects, 301
hole, 223internal conversion, 6
inverse square law, 66, 612
ionization chamber, 162, 169
advantages and disadvantages, 181
applications, 181
boron-lined, 179
compensated, 180
cylindrical, 174
gases, 177
IV-characteristics, 170
liquid filled, 229
parallel plate, 170
Frisch grid, 178
pulse shape, 174
time constant, 173
ionization potential, 151