(PFM) measurements ( 21 )ofthecrystalline
LaWN 3 film synthesized on the heated sub-
strate (Fig. 1 and figs. S1 and S2). We used a
<25-nm-radius tip to probe the electromechan-
ical response of uncapped crystalline thin films
that were insulating according to conductive
atomic force microscopy (c-AFM) measure-
ments (fig. S6). Our PFM results show qual-
itatively unambiguous piezoelectric response
(Fig. 4, A to F), with 65% of more than 4000
pixels in a map (Fig. 4D) having coefficient of
determination (R^2 ) > 0.8 fit of piezoelectric
amplitude versus drive voltage (Fig. 4E). Our
statistical analysis of these measurement re-
sults (Fig. 4F) in terms of mean and median
1490 17 DECEMBER 2021¥VOL 374 ISSUE 6574 science.orgSCIENCE
500 500
400 400
300 300
200 200
100 100
00
Piezoelectric Amplitude (pm)
0 2 4 6 8 10 12
Drive Voltage (V)
65% of pixels have R
2
> 0.8
R^2 =0.800
R
2
=0.998
400
200
0
Sample Dimension (nm)
400
400
200
200
0
0
Sample Dimension (nm)
-1.2
-0.8
-0.4
0.0
0.4
0.8
1.2
Surface Height (nm)
400
200
0
Sample Dimension (nm)
400
400
200
200
0
0
Sample Dimension (nm)
1.00
0.98
0.96
0.94
0.92
0.90
0.88
0.86
0.84
0.82
0.80
R
2
40
20
0
d33,f
(pm/V)
1
1
0.95
0.95
0.9
0.9
0.85
0.85
0.8
0.8
R
2
1
2
3
4
5
6
10
2
Pixels
Mean
Q2
Q1
Q3
Q2
Mean
400
200
0
Sample Dimension (nm)
400
400
200
200
0
0
Sample Dimension (nm)
60
55
50
45
40
35
30
25
20
15
10
33,fd
(pm/V)
AC E
F
400
200
0
Sample Dimension (nm)
400
400
200
200
0
0
Sample Dimension (nm)
180
160
140
120
100
80
60
40
20
0
Response Phase (degree)
B D
Fig. 4. Piezoelectric properties of LaWN 3 thin films.(A) Atomically smooth
surface of a single LaWN 3 grain. (B) Phase, (C) linearity, and (D) slope of
each of more than 4000 pixels withR^2 > 0.8 for piezoelectric amplitude versus
drive voltage fits. (E) The best and worst fits included in this analysis resulting in
(F) a three-dimensional histogram of thesed33,fandR^2 values, indicating a mean
(green) and median (magenta) value of the piezoelectric response. Analysis of
LiNbO 3 , PZT, and (Al0.92Sc0.08)N reference samples and details of the PFM
measurements are provided in the supplementary materials (figs. S7 to S10).
5.5 5.5
5.0 5.0
4.5 4.5
4.0 4.0
33
22
11
00
qy
(2
/
)
4
4
3
3
2
2
1
1
0
0
-1
-1
-2
-2
-3
-3
-4
-4
qx (2/)
qx (2/)
10
3
2 4 6810
4
2 4 6810
5
Counts
yq
(2
/
)
Counts (a.u)
100
100
90
90
80
80
70
70
60
60
50
50
40
40
30
30
20
20
Cuk diffraction angle (deg.)
W (111)
(112)(011)
(011)
(022)(233) (013) (112)
(224) (022)(123) (134)
(004) (444)(123) (114)(125) (345)
Obs.
Calc.
Diff.
wR = 4.39
20
16
12
8
4
0
nm
-1
(010)
(010)
(200)
(020)
(020)
(200)(100) (100)
800
700
600
500
400
300
200
100
0
nm
Si(100)
LaWN 3
Pt
20
15
10
5
0
nm
-1
(110)
(110)
(121)
(211)
(121)
(211)
(110)
(220)
(220)
50
45
40
35
30
25
20
15
10
5
0
(110)
A B C E
D F
a = 5.64 Å
= 60.33 Å
Fig. 3. Crystal structure of LaWN 3 thin films.(A) Two-dimensional XRD
pattern, indicating randomly oriented polycrystalline microstructure. (B) Rietveld
refinement of XRD data for LaWN 3 thin films with a predicted rhombohedral
unit cell of R3c symmetry (space group 161) and body-centered cubic (bcc)
tungsten (W) minority phase (<5% by volume). (C) STEM–HAADF (high angle
annular dark field) image of an as-deposited crystalline film highlighting a single
grain (white) and (D) SAED from this grain showing a pseudo-cubic perovskite
[001]–type pattern. (E) High-resolution image of a single grain showing the
pseudo-cubic (011) lattice spacing and (F) the associated fast Fourier transform
indexed with a pseudo-cubic [113] type pattern.
RESEARCH | REPORTS