Figure 9.2
(a) UV/visible diode array spectrometer (Hewlett–Packard HP8450A)
using the reversed-optics configuration
(courtesy of Hewlett-Packard).
(b) Fourier-transform IR spectrometer (Nicolet brochure).
the thickness of the absorbing medium, and k is a constant determined by the wavelength of the
radiation and the nature of the sample. Rearrangement of the above equation and converting to log to
the base 10,