Tubes, Discrete Solid State Devices, and Integrated Circuits 363
Figure 12-76. Typical digital circuits and their characteristics for the major logic families. (Adapted from Reference 4.)
Symbol Circuit Diagram Speed* Power* Fan-Out* Noise Trade Remarks
Immunity* Name
DCTL Medium Medium Low Low Series 53
RTL Low Low Low Low RTL
RCTI Low Low Low Low Series 51
DTL Medium Medium Medium Medium 930
to high DTL
TTL High Medium Medium Medium SUHL
to high Series 54/74
CML High High High Medium MECL
(ECL) to high ECCSL
CTL High High Medium Medium CTML
I^2 L High Low High Medium I^2 L
Variations in input characteristics result in
base current “hogging” problems. Proper
operation not always guaranteed. More
susceptibile to noise because of low
operating and signal voltages.
Very similar to DCTL. Resistors resolve
current “hogging” problem and reduce
power dissipation. However,operating
speed is reduced.
Though capacitors can increase speed
capability, noise immunity is affected by
capacitive coupling of noise signals.
Use of pull-up resistor and charge-control
technique improves speed capabilities.
Many variations of this circuit exist, each
having specific advantages.
Very similar to DTL. Has lower parasitic
capacity at inputs. With the many
existing variations, this has become very
Similar to a differential amplifier, the
reference voltage sets the threshold
voltage. High-speed, high-fan-out oper-
ation is possible with associated high
power dissipation. Also known as
emitter-coupled logic (ECL).
More difficult manufacturing process
results in compromises of active device
characteristics and higher cost.
Provides smallest and most dense bipolar
gate. Simple manufacturing process and
higher component packing density than
the MOS process. Also known as
merged-transistor logic (MTL).
*Low = <5 MHz <5 mW <5 <300 mV
Medium = 5–15 MHz 5–15 mW 5–10 300–500 mV
High = >15 MHz >15mW >10 >500 mV
+V
+V
+V
+V
+V
C1
C2
+V
+V
+V