number of defects, and assist in determining which process variables should be carefully con-
trolled during manufacturing to prevent high defect levels and erratic process performance.An Optimization Experiment
In a characterization experiment, we are interested in determining which factors affect the
response. A logical next step is to determine the region in the important factors that leads
to an optimum response.For example, if the response is cost, we will look for a region of
minimum cost.
As an illustration, suppose that the yield of a chemical process is influenced by the op-
erating temperature and the reaction time. We are currently operating the process at 155F
and 1.7 hours of reaction time, and the current process yield is around 75%. Figure S14-2
shows a view of the time–temperature space from above. In this graph we have connected
points of constant yield with lines. These lines are yield contours,and we have shown the
contours at 60, 70, 80, 90, and 95% yield. To locate the optimum, we might begin with a
factorial experiment such as we described below, with the two factors, time and temperature,14-2Input Output...
Controllable factors
x 1 x 2 xpz 1 z 2 zq
Uncontrollable (noise) factors...
(printed circuit boards) (defects, y)Process
(flow solder machine)Figure S14-1 The
flow solder
experiment.Figure S14-2
Contour plot of yield
as a function of reac-
tion time and reaction
temperature, illustrat-
ing an optimization
experiment.0.51401.0 1.5
Time (hr)2.0 2.5150160170180190200Temperature (°F)95%Current
operating
conditions90%82%70%60%58%
80%75%56% 69%Path leading to region
of higher yieldPQ220 6234F.CD(14) 5/9/02 8:39 PM Page 2 RK UL 6 RK UL 6:Desktop Folder:TEMP WORK:MONTGOMERY:REVISES UPLO D CH114 FIN L: