Scanning Electron Microscopy and X-Ray Microanalysis

14 6

9

References

Hren J (1986) Barriers to AEM: contamination and etching. In: Joy D,

Romig A, Goldstein J (eds) Principles of analytical electron micros-

copy. Plenum, New York, p 353

Postek M, Vladar A (2014) Does your SEM really tell the truth? How

would you know? Part 2. Scanning 36:347

Moire effects

at fine edges

. Fig. 9.18 Moiré effects seen as periodic bright flares at the edge
of fine structures in NIST RM 8820 (magnification calibration artifact);
Everhart–Thornley (positive bias) detector

Chapter 9 · Image Defects