Scanning Electron Microscopy and X-Ray Microanalysis

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22


.

Table 22.7a

Analysis of SRM 481 (Au-Ag alloys); 1970s metallographic preparation, original surface;

E^0

=
5 keV; standards: S (FeS

); Cl (KCl); Ag, Au 2

Alloy

Raw analytical total

S (norm mass conc)

σ(%)5 loc

Cl (norm mass conc)

σ(%) 5 loc

Au (norm mass conc)

σ(%)5 loc

RDEV(%)

Ag (norm mass conc)

σ(%) 5 loc

RDEV (%)

20Au–80Ag

0.9855

0.0934

4.4

0.1061

12

0.0796

12


64

0.7210

0.44


7

40Au–60Ag

0.9959

0.0311

5.7

0.0965

10

0.3440

6.1


14

0.5284

2.2


12

60Au–40Ag

0.9951

0.0094

5

0.045

22

0.5754

4.7


4.2

0.3706

4.6


7.2

80Au–20Ag

1.005

0.0051

8.3

0.0365

4.5

0.7340

0.67


8.3

0.2244

1.6

+12

.

Table 22.7b

Analysis of SRM 481 (Au-Ag alloys); surface after first repolishing with 0.25-

μm diamond;

E^0

=
5 keV; standards: Ag, Au

Alloy

Raw analytical total

Au (norm)

σ(%) 5 loc

RDEV (%)

DTSA-II error budget (%)

Ag (norm)

σ(%) 5 loc

RDEV (%)

DTSA-II error budget (%)

20Au–80Ag

0.9731

0.3050

7.1

+36

0.34

0.6950

3.1


10.4

0.75

40Au–60Ag

0.9920

0.4460

0.96

+11.4

0.25

0.5540

0.77


7.6

1.1

60Au–40Ag

0.9907

0.6322

1.0

+5.3

0.21

0.3678

1.8


7.9

1.5

80Au–20Ag

0.9930

0.8264

0.24

3.2

0.17

0.1736

1.1


13

2.1

Chapter 22 · Low Beam Energy X-Ray Microanalysis
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