Scanning Electron Microscopy and X-Ray Microanalysis

380

22

References

Newbury D, Ritchie N (2015) Quantitative electron-excited X-ray micro-

analysis of borides, carbides, nitrides, oxides, and fluorides with scan-

ning electron microscopy/silicon drift detector energy- dispersive

spectrometry (SEM/SDD-EDS) and NIST DTSA-II.  Micros Microanal

21:1327

Newbury D, Ritchie N (2016) Electron-excited X-ray microanalysis at low

beam energy: almost always an adventure! Micros Microanal

22:735–753

Chapter 22 · Low Beam Energy X-Ray Microanalysis