Scanning Electron Microscopy and X-Ray Microanalysis

423 24

10 m

Cr

Al Cr Ni

NiKα

FeKα

CrKα NiKβ

AlK

NiL

Log 10 SUM

Relative intensity

SUM

MAXIMUM PIXEL

1.0

0.9

0.8

0.7

0.6

0.5

0.4

0.3

0.2

0.1

0.0

500 1000 1500

SumLog sumMax running sumlog running sum running max

. Fig. 24.9 Use of the MAXIMUM PIXEL spectrum to identify and locate an unexpected Cr-rich inclusion in Raney nickel alloy

24.2 · X-Ray Spectrum Imaging