Scanning Electron Microscopy and X-Ray Microanalysis

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artifact? To examine this question, the analyst can use pixel
masks of each phase selected from the Ni compositional map
(or the BSE image) to obtain the SUM spectrum, as shown in


. Figs. 24.18 (Fe-rich phase), 24.19 (Al-rich phase), 24.20
(Ni-intermediate phase), and 24.21 (Ni-rich phase). These
SUM spectra confirm that Fe is indeed present as a trace


constituent, with its highest level in the intermediate-Ni phase
where CFe = 0.0027 (2700  ppm), falling to CFe = 0.00038
(380  ppm) in the high-Ni phase and to CFe = 0.00030
(300  ppm) in the high-Al phase. Additionally, trace Cr at a
similar concentration is found in the Al-rich phase along with
the trace Fe.

1000000

100000

10000

(^1000) Ni
Ni Al
Cr
Cr
Mn
Mn Fe
Fe
Ni
Ni
Cu
Cu
Zn
Zn
Raney1-Mask_
highFephase
Ni
Al
O
100
012345
Energy (keV)
Counts (Log)
6 78910
Ni
Ni
Ni Al
Al
Cr
Cr
Mn
Mn
Fe
Fe
Ni
CuNi
Cu
Zn
Zn
Raney1-Mask

highFe_phase
O
24000
22000
20000
18000
16000
14000
12000
10000
8000
6000
4000
2000
0
Counts
012345
Energy (keV)
6 78910
Ni
Fe=0.044
Al
Cr Mn
Al+NiL
Al+Al
Fe-rich phase


. Fig. 24.18 Raney nickel alloy XSI: mask of pixels corresponding to the Fe-rich phase and the corresponding SUM spectrum; the Fe peak corresponds
to C = 0.044 mass fraction


24.3 · Quantitative Compositional Mapping

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