reSeArcH Article
Extended Data Fig. 2 | Microscopy image of a full fabricated RV16X-
NANO die. The processor core is in the middle of the die, with test
circuitry surrounding the perimeter (when the RV16X-NANO is diced for
packaging, these test structures are removed). The test structures include
test structures for monitoring fabrication, as well as for measuring and
characterizing all of the 63 standard cells in our standard cell library.