358 CHAPTER 8. FIELD EFFECT TRANSISTORS
Gate controlled carrier density in the channel
Source Drain
Gate
Figure 8.2: The physical principle behind the FET involves the use of a gate to alter the charge
in a channel. Depending upon the method used for isolation of gate different FETs arise.
The thickness of the doped active channel ishas shown in figure 8.3 andVbiis the built-
in voltage. The gate bias required to pinch off the channel is simply given by the depletion
approximation
h=
{
2 (Vbi−VGS)
eNd
} 1 / 2
(8.2.1)
It is possible that the built-in voltage may by itself pinch the channel off. In ann-channel
device, if the device is not pinched off byVbi, then a negative gate bias will cause pinch-off.In
ap-channeldevice,apositivebiasisneededforpinch-off.
The pinch-off voltageVp(called the intrinsic pinch-off voltage) is defined by
Vp=
eNdh^2
2
(8.2.2)
and the gate bias needed for pinch-off for then-channel device is
VT=Vbi−Vp (8.2.3)
whereVTis called the threshold voltage for the device. If the voltageVpis smaller than the
built-in potentialVbi, the device channel is completely depleted in the absence of a gate bias.
A positive gate bias (forn-channel devices) can allow the channel to have free charge and be
conducting. Such devices are said to be enhancement-mode devices. On the other hand, ifVp
is larger thanVbi, the device has free charge in the channel atVG= 0 since the channel is only
partially depleted. A negative gate bias will then turn the device off, i.e., deplete the channel.
Such devices are said to operate in the depletion mode. Electronic circuits may use enhancement-
or depletion-mode devices or even combinations of them, depending upon the application.