Scanning Electron Microscopy and X-Ray Microanalysis

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. Fig. 17.36 Menu for
selecting number of trajectories,
repetitions, and X-ray generation
modes


to simulate measured spectra like a spectrum collected from
the specified material under the specified conditions on the
specified detector. You can treat simulated spectra like
measured spectra in the sense that you can simulate an
“unknown” standards and reference spectra and quantify the
“unknown” as though it had been measured (. Fig. 17.42).
The report tab contains additional details about the simu-
lation including configuration and results information. The
first table summarizes the simulation configuration
parameters. This table is available for all simulation modes
(. Fig. 17.43).
The “simulation results” table contains additional
details derived from the simulation. The first two lines
contain links to the simulated spectrum and a Virtual
Reality Markup Language (VRML) representation of the
sample and electron trajectories. The subsequent rows
contain raw data detailing the generation and emission of
various different kinds of characteristic X-rays. Only those
modes which were selected will be available. The generated
X-rays column tabulates the relative number of X-rays

generated within the sample and emitted into a milli-stera-
dian. The emitted column tabulates the X-rays that are
generated and also escape the sample in the direction of
the detector. The ratio is the fraction of generated X-rays
that escape the sample in the direction of the detector. The
final rows compare the relative amount of characteristic
fluorescence to the amount of primary characteristic and
bremsstrahlung emission (. Fig. 17.44).
The emission images show where the measured X-rays
were generated. Because the images only display X-rays
that escape the sample, the distinction between the strongly
absorbed X-rays like the O K-L3 (Kα) and the less strongly
absorbed like the Si K-L3 (Kα) is evidenced by the flattened
emission profile in the Si K-L3 image. The last image shows
the first 100 simulated electron trajectories (down to a
kinetic energy of 50  eV.) The color of the trajectory seg-
ment varies as the electron passes through the different
materials present in the sample. The gray lines exiting the
top of the image are backscattered electrons (trajectories in
vacuum).

Chapter 17 · DTSA-II EDS Software
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