Scanning Electron Microscopy and X-Ray Microanalysis

377 22

20Au-80Ag alloy, original surface

20Au-80Ag alloy, 1st-repolishing (0.25 μm)

E 0 = 5 keV

Photon energy (keV)

Counts

20000

15000

15000

10000

5000

0

10000

5 000

0

0

123 4

1 234

20Au80Ag_repolished

20Au80Ag_residual

5

Counts

Photon energy (keV)

NIST DTSA-II

Quantitative analysis

20Au80Ag, 1st-repolishing

E 0 = 5 keV

. Fig. 22.23 NIST SRM 481 (Au-Ag alloys). Analysis of an old (>30 years) metallographic preparation at E 0 = 5 keV, and the spectrum after repolish-
ing with 0.25 μm diamond abrasive

22.3 · Challenges and Limitations of Low Beam Energy X-Ray Microanalysis