Scanning Electron Microscopy and X-Ray Microanalysis

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a

0

10

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40

50

60

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Bulk K4 11

Shards_overscan

Shards_fixed-beam

Macroscopic chips

Surface voids

Bulk-600grit

Mg (normalized weight percent)

Fe (normalized weight percent

)

Analysis of K4 11 : Bulk polished, 600 Grit, In-hole, Chips, Shards

11 .3

11 .4

11 .5

8.68.8

BULK

Mg (normalized weight

percent)

Fe

(nor

malized

weight

pe

rcent)

Ideal flat surface

b

Analysis with a compromised sample shape

. Fig. 23.9 a Examples of deep narrow pits produced in K411 glass
by impacts of a diamond scribe; microscopic particles (major dimen-
sions <50 μm); and macroscopic particles (major dimensions >500 μm).

b Plot of the normalized Mg and Fe concentrations calculated for mea-

surements at various locations on these objects combined with the

measurements previously plotted

Chapter 23 · Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles