INDEX 559
SiC, 21
Silicon dioxide-silicon junction, 230
Silicon nitride, 231
Six equivalent valleys, 48
Small signal capacitance, 306
Small signal equivalent circuit of a diode,
306
Small signal figures of merit, 340
fτ, 340
fmax, 341
Source resistance, 413, 414
Space charge transit time (τtransit), 415
Specific contact resistance, 230
Spin, 42
Split-off band, 47
Split-off energy, 47
Spontaneous emission rate, 200
Spontaneous polarization, 65
Storage delay time, 317
Strain energy, 20
Strain tensor, 69
Strained heterostructures, 17, 80
Strong injection, 131
Substrates, 194
Al 2 O 3 ,26
AlN, 26
GaAs, 26
GaN, 26
Ge, 26
InP, 26
InSb, 26
Si, 26
SiC, 26
ZnO, 26
Superlattice, 11
(GaAs) 2 (AlAs) 2 ,11
Surface, 12
Surface donor, 390, 392, 394
Surface state, 84, 389
Switching characteristics of diodes, 312
τtransit,see Space charge transit time
T-gate, 378
Tensile strain, 394
Three-dimensional electron slab, 68
Threshold voltage, 358, 387
Time-dependent continuity equation, 333
Transconductance, 264, 338, 367, 378, 411,
414
Transit time, 307, 414
Transition time, 317
Transport, 94, 121
Averaging procedures, 526
Triangular quantum well, 377, 382, 383
Tunneling, 180, 230, 396
Tunneling probability, 181
Turn-off, 315
Turn-on response, 313
UnbiasedP-Njunction, 146
Unit cell, 2
Vbr,see Breakdown voltage
vsat,see Velocity saturation
Vacuum energy, 44
Vacuum level, 147, 219
Valence band, 44, 83
Valence band discontinuity, 232
Velocity
Overshoot, 403, 430
Saturation, 111, 368, 415
Vertical transitions, 129
Weak injection, 132
Work function, 44, 147, 219
Wurtzite, 65, 67,see Crystal structure
Zener breakdown, 180
Zener diode, 115
Zener tunneling, 115, 181