Scanning Electron Microscopy and X-Ray Microanalysis

(coco) #1
110

6


References


Boyde A (1973) Quantitative photogrammetric analysis and qualitative
stereoscopic analysis of SEM images. J Microsc 98:452
Boyde A (1974a) A stereo-plotting device for SEM micrographs and a
real time 3-D system for the SEM.  In: Johari O (ed) SEM/1974. IIT
Research Institute, Chicago, p 93
Boyde A (1974b) Photogrammetry of stereo pair SEM images using
separate measurements from the two images. In: Johari O (ed)
SEM/1974. IIT Research Institute, Chicago, p 101

Postek MT, Vladar AE, Ming B, Bunday B (2014) Documentation
for Reference Material (RM) 8820: a versatile, multipurpose
dimensional metrology calibration standard for scanned par-
ticle beam, scanned probe, and optical microscopy. NIST Special
Publication 1170 7 https://www-s.nist.gov/srmors/view_detail.
cfm?srm=8820
Wells O (1974) Scanning electron microscopy. McGraw-Hill, New York

Chapter 6 · Image Formation
Free download pdf