Scanning Electron Microscopy and X-Ray Microanalysis
328 20 d 1.40 1.50 1.60 1.70 1.80 1.90 2.00 2.10 2.20 2.30 2.40 2.50 40 000 30 000 20 000 10 000 0 Photon energy (keV) Counts e ...
329 20 g h 0 4.0 4.2 4.4 4.6 4.8 5.0 5.2 5.4 5.6 5.86.0 6.26.4 6.66.8 7.0 Photon energy (keV) Counts 1.40 1.50 1.60 1.70 1.80 1. ...
330 20 and nsam and nstan are the numbers of measurements of the sample and standard. The corresponding precision in the measure ...
331 20 Mo C = 0.2148 ± 0.0006 or 0.215 ± 0.28 % W C = 0.7852 ± 0.0024 or 0.785 ± 0.31 % If multiple locations are measured under ...
332 20 Comparing the first (150-nA-s dose) and the second spectra (300-nA-s dose), the Na intensity is seen to fall by more than ...
333 20 . Table 20.13 DTSA-II analysis of Corning Glass A (E 0 = 15 keV), oxygen by assumed stoichiometry, fixed beam Element As- ...
334 20 Counts Photon energy (keV) Corning Glass A E 0 = 15 keV 100 μm square 50 μm square 20 μm square 5 μm square 2 μm square 1 ...
335 20 Fixed Beam 5 kX 2 kX 1 kX 10 kX 20 kX 0.12 0.10 0.08 0.06 Concentration (mass)0.04 0.02 0.00 1e-5 1e-4 1e-3 1e-2 1e-1 Na ...
336 20 CO, CO 2 , and H 2 O that evaporate into the vacuum, causing substantial mass loss from the interaction volume. At the hi ...
337 20 passing through a section consisting of carbon approxi- mately 100–200 nm in thickness will be less than 500 eV. This con ...
338 20 dimensions of the thin section, so that the region continues to change during electron bombardment also violates the fund ...
339 20 References Echlin P (1998) Low-voltage energy-dispersive X-ray microanalysis of bulk biological specimens. Microsc Microa ...
© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...
342 21 “Trace analysis” refers to the measurement of constituents presents at low fractional levels. For SEM/EDS the following a ...
343 21 photon energies, the concentration limit of detection, CDL, must have a finite, non-zero value that will be found at some ...
344 21 K493 Residual after peak fitting Counts Counts 10 0000 10 000 1000 100 10 K493 E 0 = 20 keV 0.1-20 keV = 15.1 million cou ...
345 21 trace constituents that might be present in regions of the spec- trum that consist only of the X-ray continuum background ...
346 21 The Inevitable Physics of Remote Excitation Within the Specimen: Secondary Fluorescence Beyond the Electron Interaction V ...
347 21 Si E 0 = 20 keV a Coun ts 1000000 100 000 10 000 1000 100 0.0 1.0 2.0 3.0 Photon energy (keV) 4.0 5.0 6.0 7.0 8.0 9.0 10. ...
348 21 NIST DTSA II Simulation: Cubic Particle Embedded in a Bulk Matrix . Figure 21.7(a) shows the results of a simulation of a ...
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