Scanning Electron Microscopy and X-Ray Microanalysis

370 22 Photon energy (keV) Counts 50000 40000 30000 20000 10000 0 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 Ti E 0 = 5 keV Ti_ ...

371 22 Photon energy (keV) Counts BaCl 2 E 0 = 5 keV 35000 140000 120000 100000 80000 60000 40000 20000 0 30000 25000 20000 1500 ...

372 22 . Table 22.5 Analysis of YBa 2 Cu 3 O7-X at E 0 = 2.5 keV Element Cav mass conc RDEV % σrel, % Cav mass conc RDEV % σrel, ...

373 22 22.3.3 At Low Beam Energy, Almost Everything Is Found To Be Layered Most “pure” elements have surface layers such as nati ...

374 22 Photon energy (keV) Counts E 0 = 2.5 keV Ti TiSi 2 Photon energy (keV) Counts Ti E 0 = 2.5 keV E 0 = 5 keV E 0 = 10 keV 0 ...

375 22 Counts Photon energy (keV) Benitoite BaTiSi 3 O 9 2.5 keV 5 keV 10 keV 20 keV 0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10. ...

376 22 E 0 = 2.5 keV TiB 2 Residual: B and Ti L fitting E 0 = 2.5 keV TiB 2 Residual: B and Ti L fitting Residual: B, C, O and T ...

377 22 20Au-80Ag alloy, original surface 20Au-80Ag alloy, 1st-repolishing (0.25 μm) E 0 = 5 keV Photon energy (keV) Counts 20000 ...

378 22 . Table 22.7a Analysis of SRM 481 (Au-Ag alloys); 1970s metallographic preparation, original surface; E^0 = 5 keV; standa ...

379 22 . Table 22.7c Analysis of SRM 481 (Au-Ag alloys); surface after second repolishing with 1- and 0.25- μm diamond; E^0 =^ 5 ...

380 22 References Newbury D, Ritchie N (2015) Quantitative electron-excited X-ray micro- analysis of borides, carbides, nitrides ...

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382 23 There are two “zero-th level” assumptions that underpin the basis for quantitative electron-excited X-ray microanalysis: ...

383 23 increasing tilt due to the increased backscattering seen in . Fig. 23.1. There is a relatively small decrease in the k-ra ...

384 23 23.2 What Degree of Surface Finish Is Required for Electron-Excited X-ray Microanalysis To Minimize Geometric Effects? Ea ...

385 23 etching is usually required to produce contrast from grains at different crystallographic orientations and from composi- ...

386 23 . Figure 23.9a shows examples of additional geometric shapes created with K411 glass: deep, narrow pits from diamond scri ...

387 23 Analysis with a compromised sample shape: surface gouge crater left by tool impact a Mg (normalized weight percent) Fe (n ...

388 23 a 0 10 20 30 40 50 60 70 80 012345678910 11 12 Bulk K4 11 Shards_overscan Shards_fixed-beam Macroscopic chips Surface voi ...

389 23 measurement conditions, but a low total can also reveal the presence on an unexpected elemental constituent that is not i ...