Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis Joseph I. Goldstein Dale E. Newbury Joseph R. Michael Nicholas W.M. Ritchie ...

Scanning Electron Microscopy and X-Ray Microanalysis ...

Joseph I. Goldstein Dale E. Newbury Joseph R. Michael Nicholas W.M. Ritchie John Henry J. Scott David C. Joy Scanning Electron M ...

ISBN 978-1-4939-6674-5 ISBN 978-1-4939-6676-9 (eBook) https://doi.org/10.1007/978-1-4939-6676- Library of Congress Control Numbe ...

V Preface This is not your father’s, your mother’s, or your grandparent’s Scanning Electron Microscopy and X-Ray Microanalysis ( ...

VI Throughout their history, the authors of the SEMXM textbooks have been closely associated as lecturers with the Lehigh Univer ...

VII Scanning Electron Microscopy and Associated Techniques: Overview Imaging Microscopic Features The scanning electron microsco ...

VIII threshold. This threshold can only be lowered by increasing beam current, pixel dwell time, and/or detector efficiency. Sel ...

IX A negative consequence of using a small aper- ture to reduce the convergence/divergence angle is a reduction in beam current. ...

X spatial distortion due to foreshortening. The true three-dimensional nature of the speci- men can be recovered by applying the ...

XI combinations of elements, for example, Ti and Ba; S, Mo, and Pb; and many others, especially when the peaks of major constitu ...

XII . Fig. 7 a EDS X-ray intensity maps for Al, Fe, and Ni and color overlay; Raney nickel alloy; E 0 = 20 keV. b SEM/BSE (sum) ...

XIII Measuring the Crystal Structure An electron beam incident on a crystal can undergo electron channeling in a shallow near-su ...

XIV Modeling Electron and Ion Interactions An important component of modern Scanning Electron Microscopy and X-ray Microanalysis ...

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1 Electron Beam—Specimen Interactions: Interaction Volume Contents 1.1 What Happens When the Beam Electrons Encounter Specimen ...