Scanning Electron Microscopy and X-Ray Microanalysis
183 12 the mean free path for gas collisions increases rapidly with increasing electron energy thus decreasing the frequency of ...
18 4 12 and BSE. An example of an induced-field SE detector image is shown in. Fig. 12.10 (right). 12.7 Contrast in VPSEM In gen ...
185 12 of the cavity, the SEs generated deep in the cavity create addi- tional generations of cascade multiplication, increasing ...
© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...
188 13 Software is an essential tool for the scanning electron micros- copist and X-ray microanalyst (SEMXM). In the past, soft- ...
189 13 plugins and enhancements to the bare ImageJ2 application (Schindelin et al. 2012 ). It is often thought of as “ImageJ wit ...
19 0 13 functionality they encounter. Upon activation the updater will scan your local Fiji installation and calculate checksums ...
191 13 developed by the Machine Learning Group at the University of Waikato in New Zealand (Hall et al. 2009 ). WEKA is a full- ...
192 13 . Fig. 13.3 Application of Fiji’s CLAHE processing to a low- contrast SEM images a and the resulting enhanced image b. Th ...
193 13 a b . Fig. 13.4 a Fiji’s Manage Update Sites window, showing some of the many optional plugin repositories available for ...
© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...
12 Variable Pressure Scanning Electron Microscopy (VPSEM) Microscopy (VPSEM) – 200 14.8.1 VPSEM Advantages – 200 14.8.2 VPSEM Di ...
197 14 14.1 Specimen Considerations (High Vacuum SEM; Specimen Chamber Pressure < 10 −^3 Pa) 14.1.1 Conducting or Semiconduct ...
198 14 with surface tilt (topographic contrast). SE emission increases as the beam energy decreases. Three classes of SEs are re ...
19 9 14 Strategy 1 Choose the highest available beam energy, E 0 ≥ 25 keV. The SE 1 component of the total SE signal retains the ...
200 14 14.7.3 Contrast Encoding SEM image contrast is carried by number effects (different numbers of electrons leave the specim ...
© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...
202 15 15.1 Case Study: How High Is That Feature Relative to Another? When studying the topographic features of a specimen, the ...
203 15 . Fig. 15.3 “3D Viewer” rotation of the rendered surface 100 μm . Fig. 15.4 Step height to be measured (yellow arrow) . F ...
204 15 Parallax = XLeft – Xright = 77.1 μm – 66.9 μm = 10.2 μm (Note that the parallax has a positive sign, so the feature is ...
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