Scanning Electron Microscopy and X-Ray Microanalysis
121 7 B-segment image, where the illumination comes from the bottom of the field, compared to the A-segment image, where the ill ...
© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...
124 8 The detection in SEM images of specimen features such as compositional differences, topography (shape, inclination, edges, ...
12 5 8 template shown in. Fig. 8.3a with a specified signal and superimposed random noise, and. Fig. 8.2b shows a plot of the si ...
126 8 The picture element dwell time, τ, can be replaced by the time to scan a full frame, tF, from the relation τ= t N F PE (8. ...
127 8 performance described by the DQE (Joy et al. 1996 ). Alternatively, if we measure the current which is available in the b ...
128 8 of the contrast) provide a useful way to understand the rela- tionships of the parameters of the Threshold Equation. These ...
129 8 alloy under various conditions. The two principal phases of this material are nearly pure Al and Si, which produce a con- ...
130 8 . Fig. 8.8 Threshold imaging visibility; image sequence with increasing pixel dwell time at constant beam current. Inkjet ...
131 8 observer effect mean that a negative result in an SEM study, that is, the failure to find an expected feature in an image, ...
© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...
13 4 9 SEM images are subject to defects that can arise from a vari- ety of mechanisms, including charging, radiation damage, co ...
135 9 in the immediate vicinity of the beam impact, raising the local potential and creating a range of phenomena described as “ ...
136 9 SE BSE . Fig. 9.3 Comparison of images of a dust particle on a metallic substrate: (left) Everhart–Thornley (positive bias ...
137 9 charging can result in very different imaging results as the pixel dwell time is changed from rapid scanning for survey- i ...
138 9 1 keV 1.5 keV 2 keV 5 keV Incipient Charging Artifacts . Fig. 9.7 Polystyrene latex spheres imaged over a range of beam en ...
139 9 magnification image of a large plastic sphere (5 mm in diam- eter) that was first subjected to bombardment at E 0 = 10 keV ...
14 0 9 Coating Grounding connection from coating to ground (e.g., conducting tape, wire) Bare, insulating surface Rotate specime ...
141 9 scales with the atomic number. Note that because of pulse coincidence events, there will always be a small number of photo ...
142 9 coefficient will increase the relative abundance of the high resolution SE 1 signal, especially if the specimen consists o ...
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