Scanning Electron Microscopy and X-Ray Microanalysis
101 6 shows the locations of the beam at the pixel centers in the middle of the squares and the effective sampling footprint. Th ...
102 6 four successive increases in magnification reveals that as the pixel spacing becomes smaller, the beam sampling footprint ...
103 6 . Fig. 6.11 a Trivial example of optimal lens strength (focused at blue plane) and defocusing caused by selecting the obje ...
104 6 fraction of the population for whom this process is not effective at creating the sense of viewing a three-dimen- sional o ...
105 6 along the vertical. In either case, note the location of the Everhart–Thornley detector in the image, which will provide t ...
106 6 Fixed Specimen, Beam Incidence Angle Changed The beam incidence angle relative to the specimen can be changed by a small v ...
107 6 topography. This is especially true at high magnification when the act of mechanical stage tilting is more likely to cause ...
108 6 (Boyde 1973 , 1974a,b; Wells 1974 ). This procedure can be accomplished even if the operator is not personally able to per ...
109 6 effects can be minimized by selecting the initial (low) tilt value to correspond to a well-defined detent position if the ...
110 6 References Boyde A (1973) Quantitative photogrammetric analysis and qualitative stereoscopic analysis of SEM images. J Mic ...
© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...
112 7 7.1 Information in SEM Images Information in SEM images about specimen properties is conveyed when contrast in the backsca ...
113 7 7.2.2 Calculating Atomic Number Contrast An SEM is typically equipped with a “dedicated backscat- tered electron detector” ...
114 7 actually enhances the atomic number contrast over that esti- mated from the composition (Al-0.02Cu, η = 0.155; CuAl 2 , η ...
115 7 distribution η(φ) ≈ cos φ (where φ is an angle measured from the surface normal) that is rotationally symmetric around the ...
116 7 with the specimen results in backscattering of beam electrons and secondary electron emission (type SE 1 produced by the b ...
117 7 from the specimen) and an indirect component that acts like diffuse illumination (SE 3 collected from all surfaces struck ...
118 7 down on the features of the specimen. When the top lighting condition is violated and the observer is unaware of the alter ...
119 7 selectively excluding the SE component of the total signal— either by changing the Faraday cage voltage to negative val- u ...
120 7 . Fig. 7.8 a SEM/E–T (posi- tive bias) image of a fractured fragment of pyrite; E 0 = 20 keV. b SEM/E–T (negative bias) im ...
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