Scanning Electron Microscopy and X-Ray Microanalysis

536 31 31.4 Current Generation and Data Collection in the HIM A typical ion beam microscope operates at energies selected betwee ...

537 31 imaging (RBI)” (Rutherford 1911 ). Some fraction of the inci- dent ion beam is deflected though an angle greater than 90° ...

538 31 form of flexible sheets which may be only by a few atom layers in thickness and yet can readily be cut and shaped as requ ...

539 31 contained in the sample chamber in the usual way, but on one side of the chamber is a shutter which can be opened or clos ...

541 Supplementary Information Appendix – 542 Index – 547 © Springer Science+Business Media LLC 2018 J. Goldstein et al., Scannin ...

542 Appendix A Database of Electron–Solid Interactions Compiled by David C Joy EM Facility, University of Tennessee, and Oak Rid ...

543 to the suitability, or otherwise, of any given piece of information. The database currently contains several thousand indivi ...

544 The database contains experimentally determined stop- ping power curves for a collection of elements and com- pounds. The me ...

545 Bruining H (1942) Die Sekundt- Elektronen Emission Fester Korper. Springer-Verlag, Berlin Neubert G, Rogaschewski S (1980) ...

546 Horakeri LD, Hanumaiah B, Thontadarya SR (1997) X-ray Spectr 26:69 Mearini GT, Krainsky IL, Dayton JA, Wang X, Zorman CA, A ...

Index A Aluminum wire failures 482–483 Anaglyph stereo pair presentation 218 Ancient impact zircons 493 Angular distribution, ba ...

548 Energy dispersive X-ray spectrometry (EDS) xi adequate counts 297–298 beam current 330–332 beam energy 297, 330 coincidence ...

549 sets of 309 uncertainties in 309 waters of crystallization 311 ZAF factors, microanalysis 317–324 k-ratio/matrix correction ...

550 Scanning electron microscope (SEM) instrumentation (cont.) electron optical parameters astigmatism 85–87 beam convergence a ...