Scanning Electron Microscopy and X-Ray Microanalysis

515 29 Coates D (1967) Kikuchi-like reflection patterns observed in the scan- ning electron microscope. Philos Mag 16:1179 Deal ...

© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...

518 30 30.1 Introduction The use of focused ion beams (FIB) in the field of electron microscopy for the preparation of site spec ...

519 30 with the target material is helpful in reducing the amount of damage to acceptable or tolerable levels through appropriat ...

520 30 not capable of focusing the heavier ions. For ions, the lenses are electrostatic and require high voltages to focus energ ...

521 30 bright relative to the brass as in. Fig. 30.6.. Figure 30.7 demonstrates that the iSE yield is not a simple function of t ...

522 30 sputter site specific regions of the sample to produce cross sections. It is also common to produce samples that are mani ...

523 30 ab cd 5 mm 5 mm 5 mm 5 mm . Fig. 30.9 Required steps to making a quality cross section of the surface of a corroded coppe ...

524 30 SEM applications of FIB sample preparation can also uti- lize samples that have been removed from the bulk material. This ...

525 30 ab c e d . Fig. 30.12 Gibeon meteorite sample produced by the lift-out method to produce large area samples suitable for ...

526 30 trench that is cut is sufficiently wide to prevent the accumula- tion of redeposited material (material sputtered from th ...

527 30 c d a b . Fig. 30.14 Image reconstruction of a plated stainless steel test coupon. Each section was milled perpendicular ...

528 30 References Giannuzzi L, Michael J (2013) Comparison of channeling contrast between ion and electron images. Microsc Micro ...

© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...

530 31 Electron beams have made possible the development of the versatile, high performance electron microscopes described in th ...

531 31 HIM SEM 1μm 1μm 50 nm a b . Fig. 31.2 a Gold islands on carbon as viewed by SEM and HIM under optimized conditions for ea ...

532 31 1.5 mm 100 nm 100 μm a b . Fig. 31.4 a Image of two tungsten wires wetted by gal- lium. In this large field of view, the ...

533 31 target, which can locally alter the target composition, ions of higher mass, such as Ga+ and above, have higher sputterin ...

534 31 SEM, to fully optimize the performance of the HIM it is nec- essary to pay more attention to certain details. The ion sou ...

535 31 κ = 80 nm, and P = 0.72, so the range versus density plot has the form shown in. Fig. 31.7 which also shows the corre- sp ...