Scanning Electron Microscopy and X-Ray Microanalysis

452 25 of particles often make it difficult to apply a suitable coating. The VPSEM with its charge dissipation through gas ioniz ...

453 25 3453 a Ch kV; Work: 51 SiKa Ka Ka MgKa S Ka K Ka CaKa Ti Ka FeKa Ti Kb1 FeKb1 O Particle “A” Al Ka C 0.00 Photon energy ( ...

454 25 CaKa SiKa O Operational blank at “BL3” Al Ka 0.00 Photon energy (keV) 1.00 2.00 3.00 4.00 5.00 6.00 7.00 8.00 9.00 10.00 ...

455 25 A B C D E BL1 BL2 BL3 0.00 Photon energy (keV) 1.00 2.00 3.00 4.00 5.00 6.00 7.00 8.00 9.00 10.00 Photon energy (keV) 0.0 ...

456 25 Raney nickel E 0 = 20 keV BSED I B 100 μm D . Fig. 25.14 SEM-BSE image of Raney nickel in a VPSEM 25.2.3 Unfavorable Samp ...

457 25 Raney Nickel E 0 = 20 keV pressure < 50 Pa (0.4 torr) (^57850) Ch#: (^279) Ch kV; 2.7900 Work: 318 Results: 425 Soec# ...

458 25 AI K-L 2 E 0 = 20 keV 133 Pa 1330 Pa 2000 Pa 665 Pa a Ni K-L 2 E 0 = 20 keV 133 Pa 1330 Pa 2000 Pa 50 μm 50 μm 665 Pa b . ...

459 25 References Danilatos GD (1988) Foundations of environmental scanning electron. Microscopy Adv Electronics Electron Phys 7 ...

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462 26 26.1 Instrumentation What you will need to prepare. 26.1.1 SEM The starting point is a scanning electron microscope (SEM) ...

463 26 Electrically Isolated Stage The stage should be electrically isolated from the instrument ground. The electrically isolat ...

464 26 ness becoming increasingly critical for measurements with X-rays having energies below 1 keV—e.g., Be, B, C, N, O, F— whe ...

465 26 Be sure to turn off “adaptive shaping” or other mecha- nisms that adapt the process time dynamically depend- ing upon X- ...

466 26 Sample Orientation Sample orientation is also a critical parameter to hold con- stant. The ideal sample orientation has ...

467 26 26.4.2 Experiment Optimization Determining the peak fitting reference requirements and the optimal acquisition times can ...

468 26 Examine the intensity in the measured characteristic peak for each element in the unknown to make realistic precision go ...

469 26 Misidentified element: Many characteristic peaks can be mistaken for another element. A peak may be at the correct energ ...

470 26 from mass concentration (weight fraction) to atomic frac- tion or oxide fraction includes normalization. DTSA-II provide ...

© Springer Science+Business Media LLC 2018 J. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, https://do ...

472 27 27.1 Case Study: Characterization of a Hard- Facing Alloy Bearing Surface Background: As part of a study into the in-serv ...