Scanning Electron Microscopy and X-Ray Microanalysis

431 24 Ni Fe, 0.0027 Al Cr Ni si-escape Al+NiL Al+Al Intermediate Ni-rich phase 10000000 1000000 Counts (Log) 100000 Counts 1000 ...

432 24 Ni Fe = 0.00038 Al Cr Ni si-escape Al+NiL Al+Al High Ni-rich phase 10000000 1000000 100000 Counts (Log) Counts 10000 1000 ...

433 24 145 eV 128 eV 122.5 eV OCR (1000 ns) OCR (220 ns) OCR (470 ns) Single 10-mm^2 detector, Max OCR = 130 kHz SDD-EDS Through ...

434 24 24.4.3 Choosing the Pixel Dwell Time Once the analyst has chosen the pixel density, the product of the number of pixels i ...

435 24 Cu Pb 10 μm Zn Cu Pb Zn What is missing?! 640x480 pixels; 64 μs/pixel = ∼ 20 seconds total scan Leaded brass particle BSE ...

436 24 Photon Energy (10-eV Channel number) Relative Intensity SUM MAXIMUM PIXEL RUNNING MAX (3 card average) LOG 10 SUM NiK a C ...

437 24 Cu Ni 10 μm Zn Cu Ni Zn a Cu Ni BSE 10 μm b Pb . Fig. 24.27 Leaded brass particle XSI: a total intensity images for Cu, Z ...

438 24 Zr 31.97±0.03 31.38±0.03 50 μm ZrO 2 Ni 31.09±0.04 36.64±0.04 V 10.68±0.01 8.39±0.01 a BSE Cr 4.96±0.01 3.10±0.01 Mn 4.87 ...

439 24 References Bright D (2017) NIST Lispix, a software engine for image processing, available free at: 7 http://www.nist.gov/ ...

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442 25 While X-ray analysis can be performed in the Variable Pres- sure Scanning Electron Microscope (VPSEM), it is not pos- sib ...

443 25 The extent of the beam skirt can be estimated from the ideal gas law (the density of particles at a pressure p is given b ...

444 25 . Fig. 25.3 Selection of VPSEM gas parameters in DTSA-II for simulation . Table 25.1 Portion of the electron scattering t ...

445 25 100 Pa of oxygen requires a radial distance of approximately 190  μm, as shown in. Fig. 25.5, which plots the skirt distr ...

446 25 4 mm through water vapor, the EDS spectra measured over a pressure range from 53  Pa to 1600  Pa are superimposed, showin ...

447 25 DTSA-II Monte Carlo simulation 40Cu-60Au E 0 = 20 keV 4 mm gas path length High_vacum_40Cu-60Au_20keV High_vacum_40Cu-60A ...

448 25 magnification (largest scan field) over a series of working dis- tances. The false color scale shows the while the intens ...

449 25 Extraneous X-ray peak(s) due to environmental gas 10455 Ch#: 53 Ch 0.5300 C Space# 1 2 788 924 3 1523 4 2129 5 2753 6 345 ...

450 25 . Table 25.2 Absorption of X-rays by the environmental gas (O 2 ) (40-mm source to EDS) Element/X-ray I/I 0 (2500 Pa) I/I ...

451 25 T, the sample chamber temperature (K): The scattering skirt is reduced by operating at the lowest possible tem- perature ...