Scanning Electron Microscopy and X-Ray Microanalysis
59 4 sd= cscψ (4.15) Normalizing by the intensity generated in each layer, the φ(ρz) histogram gives the probability, with a val ...
60 4 . Fig. 4.22 a Absorption parameter f(χ) as a function of photon energy for carbon and an incident beam energy of E 0 = 20 k ...
61 4 . Fig. 4.23 a Absorption parameter f(χ) as a function of photon energy for copper and an incident beam energy of E 0 = 20 k ...
62 4 1.0 0.8 0.6 0.4 0.2 0.0 0510 Photon energy (keV) a Absorption parameter f(c) for gold, E 0 = 20 keV 15 20 f(c ) 0510 Photon ...
63 4 References Crawford J, Cohen D, Doherty G, Atanacio A (2011) Calculated K, L and M-shell X-ray line intensities for light i ...
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66 5 14.2.1 Beam Electron Range This chapter addresses essential topics: the quantitative attri- butes of an electron beam, well ...
67 5 ing voltage, so the corresponding settings would be 30 keV for high beam energy work and 1 keV for low-voltage oper- ation. ...
68 5 found in wires, electronics, or electrical engineering. Beam current at the sample surface is a measure of the number of el ...
69 5 beam may not be physically realistic, but it is simple to understand and works well for our purposes here of under- standin ...
70 5 of the figure and converging on the sample surface. The diameter of that aperture is dapt, and the area of the aperture is ...
71 5 Because of this central role in practical use of the SEM, it is worth struggling with the mathematics until you understand ...
72 5 length) causes the beam to converge to focus before the elec- trons reach the surface of the sample. Since the electrons th ...
73 5 accumulate an electric charge when the beam electrons strike it, and the resulting electrostatic fields can warp and bend t ...
74 5 correcting the astigmatism, although it generally produces an image that is far inferior to the in-focus images obtainable ...
75 5 of the electron beam is approximately circular.. Figure 5.9 shows the sample field of view seen in. Fig. 5.8, but imaged us ...
76 5 The shallow depth-of-field in the LM arises from the properties of its glass lenses, but SEMs don’t use lenses to form dire ...
77 5 still increased at low magnification, but parts of the sample are still blurred in the image because of the large range of ...
78 5 5.3.2 High-Current Mode Like the High Depth-of-Field Mode described above, the High-Current Mode of operating the SEM is us ...
79 5 changes in beam current can be made quickly by using the coarse setting of the knob shown in. Fig. 5.15a, or the coarse kno ...
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